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arXiv 1308.3045cond-mat.supr-con
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抽头位置对HTS超导带材自场DC和AC输运特性的影响

Influence of the voltage taps position on the self-field DC and AC transport characterization of HTS superconducting tapes

M. Vojenciak, F. Grilli, A. Stenvall, A. Kling, W. Goldacker

摘要:

电流-电压(I-V)曲线是超导导线或超导带材的基本特性。当样品稳定性差时,测量I-V曲线通常是有问题的。将电压分接头焊接到导体的有源部分会影响局部冷却的有效性,并且/或者在某些设备中可能难以进行,例如故障限流器和电缆,其中胶带紧密包装。为了克服这些问题,可以将电压抽头放置在超导体的有源区之外。我们通过仿真和实验证明,这种安排导致与标准的四点方法相同的结果,它提供了更详细的信息,样品保护。相同的布置也可以用于AC传输损耗测量。然而,在这种情况下,必须特别注意,因为电流引线中的涡流损耗对总测量损耗有贡献。我们使用数值模拟来评估涡流损耗对测量的交流损耗的贡献。借助于仿真,可以确定涡流损耗的贡献是否显著,并且可能优化电流引线以减少该损耗贡献。

英文摘要:

The current-voltage (I-V) curve is the basic characteristic of a superconducting wire or tape. Measuring I-V curves is generally problematic when samples have poor stabilization. Soldering voltage taps to an active part of the conductor affects the effectiveness of the local cooling and/or can be difficult to do in certain devices such as fault current limiters and cables where the tapes are closely packed. In order to overcome these problems, voltage taps can be placed outside the active area of the superconductor. We proved both by simulations and experiments that this arrangement leads to the same results as the standard four point method and it provides more detailed information for sample protection. The same arrangement can also be used for AC transport loss measurement. However in this case particular care has to be taken because the eddy current loss in the current leads contributes to the total measured loss. We used numerical simulations to evaluate the contribution of the eddy current loss to the measured AC loss. With help of simulations one can determine whether the contribution of the eddy current loss is significant and possibly optimize the current leads to reduce that loss contribution.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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