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arXiv 1306.6158cond-mat.mtrl-sci
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Mg原子在MgO/Ag(001)埋层界面嵌入的层分辨研究

Layer-resolved study of Mg atom incorporation at MgO/Ag(001) buried interface

T. Jaouen, S. Tricot, G. Delhaye, B. Lépine, D. Sébilleau, G. Jézéquel, P. Schieffer

摘要:

结合X射线激发俄歇电子衍射实验和多重散射计算,我们揭示了Ag(001)衬底上MgO_(12)薄膜(4-6 μ m)中MgKL_(23)L_(23)俄歇跃迁的层分辨位移。利用该分辨率来证明通过将MgO膜暴露于Mg熔剂来控制Mg原子在MgO/Ag(001)界面处并入的可能性。MgO/Ag(001)功函数的显著降低在暴露阶段期间被观察到,并且反映了在界面处的带偏移变化和氧化物膜中的带弯曲效应。

英文摘要:

By combining x-ray excited Auger electron diffraction experiments and multiple scattering calculations we reveal a layer-resolved shift for the Mg KL23L23 Auger transition in MgO ultrathin films (4-6 Å) on Ag(001). This resolution is exploited to demonstrate the possibility to control Mg atoms incorporation at the MgO/Ag(001) interface by exposing the MgO films to a Mg flux. A substantial reduction of the MgO/Ag(001) work function is observed during the exposition phase and reflects, both band-offset variations at the interface and band bending effects in the oxide film.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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