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arXiv 1210.4458physics.atom-phphysics.optics
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Eu:Y2SiO5光谱烧孔光频标漂移

Shifts of optical frequency references based on spectral-hole burning in Eu:Y2SiO5

Michael J. Thorpe, David R. Leibrandt, Till Rosenband

摘要:

测量了Eu:Y_2SiO_5光谱孔的一些性质,以评估宽带孔图案作为激光频率基准的适用性。我们测量由于磁场,侧功能的相邻光谱孔,和不断变化的光探头功率的频率偏移。还执行温度不敏感点的精确校准,其中温度引起的频移被从晶体的氦气环境的压力引起的频移抵消到一阶。

英文摘要:

Several properties of Eu:Y2SiO5 spectral holes are measured, to assess the suitability of broad-band hole-patterns for use as laser-frequency references. We measure frequency shifts due to magnetic fields, side-features of neighboring spectral holes, and changing optical probe power. A precise calibration of a temperature insensitive point is also performed, where the temperature-induced frequency shift is canceled to first order by the pressure-induced shift from the crystal's helium-gas environment.

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