低温下基于Eu $^{3+}$：Y $_{2}$ SiO $_{5}$晶体的光谱窄、长期稳定的光学频率基准
Spectrally narrow, long-term stable optical frequency reference based on a Eu$^{3+}$:Y$_{2}$SiO$_{5}$ crystal at cryogenic temperature
摘要：
利用580 nm的超稳连续激光，我们在很高的光谱分辨率下对Eu $^{3+}$：Y $_{2}$ SiO $_{5}$进行了光谱烧孔。确定作为“宏观”频率参考的有用性的基本参数：线宽，温度灵敏度，长期稳定性进行了表征，使用H-脉泽稳定的频率comb. Spectral孔线宽低至6 kHz的观察和孔频率的漂移的上限被确定为5 $\pm$ 3 mHz/s的顺序。讨论了对这些光谱空穴实现激光稳频超高稳定度的必要条件。
英文摘要：
Using an ultrastable continuous-wave laser at 580 nm we performed spectral hole burning of Eu$^{3+}$:Y$_{2}$SiO$_{5}$ at very high spectral resolution. Essential parameters determining the usefulness as a "macroscopic" frequency reference: linewidth, temperature sensitivity, long-term stability were characterized, using a H-maser stabilized frequency comb. Spectral holes with linewidth as low as 6 kHz were observed and the upper limit of the drift of the hole frequency was determined to be on the order of 5$\pm$3 mHz/s. We discuss necessary requirements for achieving ultra-high-stability in laser frequency stabilization to these spectral holes.
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