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arXiv 1209.6598cond-mat.mtrl-scicond-mat.mes-hall
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硅薄膜中晶态和非晶态硅纳米团簇电荷分布的实验研究

An experimental study of charge distribution in crystalline and amorphous Si nanoclusters in thin silica films

Annett Thøgersen, Spyros Diplas, Jeyanthinath Mayandi, Terje Finstad, Arne Olsen, John F. Watts, Masanori Mitome, Yoshio Bando

摘要:

用透射电子显微镜(TEM)、电子能量损失谱(EELS)和X射线光电子能谱学(XPS)研究了薄二氧化硅层中的结晶和非晶硅纳米颗粒。我们使用XPS数据的俄歇参数的形式来分离的初始和最终状态的贡献的Si $_{2p}$能量转移。静电充电和电子屏蔽问题以及初始状态的影响也得到了解决。结果表明,纳米晶中的化学位移是由初态效应决定的,而不是由终态效应决定的,分散在SiO $_2$中的纳米晶中的硅芯空穴的电子屏蔽作用不如纯体硅中的电子屏蔽作用.

英文摘要:

Crystalline and amorphous nanoparticles of silicon in thin silica layers were examined by transmission electron microscopy (TEM), electron energy loss spectroscopy (EELS) and x-ray photoelectron spectroscopy (XPS). We used XPS data in the form of the Auger parameter to separate initial and final state contributions to the Si$_{2p}$ energy shift. The electrostatic charging and electron screening issues as well as initial state effects were also addressed. We show that the chemical shift in the nanocrystals is determined by initial state rather than final state effects, and that the electron screening of silicon core holes in nanocrystals dispersed in SiO$_2$ is inferior to that in pure bulk Si.

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