像差校正电子显微镜的本征不稳定性
Intrinsic Instability of Aberration-Corrected Electron Microscopes
摘要：
具有亚原子分辨率的像差校正显微镜将影响科学和技术的广泛领域。然而，实验观察到的修正状态的寿命只有几分钟。在这里，我们证明了修正态本质上是不稳定的;它的质量越高，它就越不稳定。分析对比度传递函数附近的最佳校正，我们定义了一个“不稳定预算”，它允许一个合理的权衡分辨率和稳定性。除非控制系统的发展，以克服这些挑战，固有的不稳定性构成了一个根本的限制，在电子显微镜的分辨率实际上可以实现的。
英文摘要：
Aberration-corrected microscopes with sub-atomic resolution will impact broad areas of science and technology. However, the experimentally observed lifetime of the corrected state is just a few minutes. Here we show that the corrected state is intrinsically unstable; the higher its quality, the more unstable it is. Analyzing the Contrast Transfer Function near optimum correction, we define an 'instability budget' which allows a rational trade-off between resolution and stability. Unless control systems are developed to overcome these challenges, intrinsic instability poses a fundamental limit to the resolution practically achievable in the electron microscope.
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