自组装量子点三维分布的电子层析分析
Analysis of the 3D distribution of self-assembled stacked quantum dots by electron tomography
摘要：
这篇论文已被作者撤回。自组装堆叠量子点的三维分布是各种光电子器件获得最高性能的关键参数。在这项工作中，我们已经测量了这种分布在3D使用针形试样制备和电子断层扫描的组合程序。我们发现，传统的二维测量的量子点的分布是不可靠的，只有一个三维分析允许生长设计和结构特征之间的准确的相关性。
英文摘要：
This paper has been withdrawn by the authors. The 3D distribution of self-assembled stacked quantum dots (QDs) is a key parameter to obtain the highest performance in a variety of optoelectronic devices. In this work, we have measured this distribution in 3D using a combined procedure of needle-shape specimen preparation and electron tomography. We show that conventional 2D measurements of the distribution of QDs are not reliable, and only a 3D analysis allows an accurate correlation between the growth design and the structural characteristics.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
