存在系统效应时测量X射线偏振：已知背景
Measuring x-ray polarization in the presence of systematic effects: Known background
摘要：
在中断了37年多之后，近年来完成天文源的X射线偏振测量的前景有所增长。不幸的是，伴随着这一长时间的中断，一直是一些混乱的统计不确定性与X射线偏振测量这些来源。我们已经启动了一个程序来执行详细的计算，这将提供与X射线偏振测量相关的不确定性的见解。在这里，我们描述了一个数学形式主义，用于确定1-和2-参数误差的幅度和位置角的X射线（线性）偏振（偏振或非偏振）背景的存在下。我们进一步审查相关的理论，包括明确区分最小可检测偏振（MDP）和偏振测量的准确性。
英文摘要：
The prospects for accomplishing x-ray polarization measurements of astronomical sources have grown in recent years, after a hiatus of more than 37 years. Unfortunately, accompanying this long hiatus has been some confusion over the statistical uncertainties associated with x-ray polarization measurements of these sources. We have initiated a program to perform the detailed calculations that will offer insights into the uncertainties associated with x-ray polarization measurements. Here we describe a mathematical formalism for determining the 1- and 2-parameter errors in the magnitude and position angle of x-ray (linear) polarization in the presence of a (polarized or unpolarized) background. We further review relevant statistics-including clearly distinguishing between the Minimum Detectable Polarization (MDP) and the accuracy of a polarization measurement.
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