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arXiv 1207.5682cond-mat.supr-conphysics.ins-det
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超导薄膜和平板样品临界电流密度测定的新技术

A new technique for the determination of the critical current density in superconducting films and flat samples

Conor McLoughlin, Pierre Bernstein, Yohann Thimont, J. Siejka

摘要:

在低于Tc的整个温度范围内确定它们的临界电流密度对于理解超导薄膜中发生的物理过程是至关重要的。我们在这里描述了一种技术,适用于方形薄膜的基础上测量的磁矩,由于在超导体中的电流持续后的应用程序的垂直高磁场。通常,对于SQUID磁强计,仅通过该技术,在具有1K间隔的整个温度范围内的测量时间为2小时。一个有趣的方面所获得的结果是,他们是更准确的,如果电流线被认为是圆形的,如果我们假设,如所建议的理论考虑和磁光观测,他们有样本对称性。

英文摘要:

The determination of their critical current density in the whole range of the temperature below Tc is of first importance to understand the physical processes occurring in superconducting films. We describe here a technique suitable for square films based on the measurement of the magnetic moment due to the currents persisting in the superconductor after the application of a perpendicular high magnetic field. Typically, with a SQUID magnetometer, the measurement time in the whole range of temperature with a 1K interval is of 2 hours only by this technique. An intriguing aspect of the obtained results is that they are much more accurate if the current lines are supposed to be circular than if we suppose, as suggested by theoretical considerations and magneto-optical observations that they have the sample symmetry.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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