通过直接测量全面表征光的偏振态
Full characterisation of polarisation states of light via direct measurement
摘要：
确定系统的物理状态对于理解和预测其行为至关重要。断层扫描是用于确定未知状态的形式的标准方法。在这里，我们表明，另一种方法，顺序弱和强的测量的基础上，可以用来确定的密度矩阵在一个简单的，快速的，和一般的风格。我们直接测量光的各种纯偏振态的概率振幅。然后，我们推广这个实验直接测量狄拉克分布，从而确定密度矩阵。我们的工作是第一个证明了直接测量的二维系统的状态的完整描述，它有应用于基础量子力学，量子信息和物理化学的测量。
英文摘要：
Ascertaining the physical state of a system is vital in order to understand and predict its behaviour. Tomography is a standard approach used to determine the form of an unknown state. Here we show that an alternative approach, based on sequential weak and strong measurements, can be used to determine the density matrix in a simple, fast, and general style. We directly measure the probability amplitudes of a variety of pure polarisation states of light. We then generalise this experiment to directly measure the Dirac distribution and consequently determine the density matrix. Our work is the first to demonstrate the direct measurement of the full description of the state of a two-dimensional system, and it has applications to measurements in foundational quantum mechanics, quantum information, and physical chemistry.
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