arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1202.3010cond-mat.supr-con
收藏

高电流密度下超导薄膜热不稳定性的分析方法

An analytical approach to the thermal instability of superconducting films under high current densities

Jesús Maza, Gonzalo Ferro, Manuel Rodríguez Osorio, José A. Veira, Félix Vidal

摘要:

利用三维热方程的格林函数,我们对在没有外加磁场的情况下,电流大于其临界电流的超导薄膜的热行为进行了分析。我们的模型假设均匀的薄膜和电流密度,除了热系数采用参数拟合实验电场-电流密度特性在恒定的浴温。我们推导出一个易于处理的动态方程的实际温度的膜的超临界电流密度J^ \ast(最低的电流密度诱导过渡到正常状态),和一个热稳定性标准,允许预测J^ \ast。对于两种典型的YBCO薄膜,J^ \ast的预测与观测结果的一致性在5%以内。这些发现有力地支持了这样的假设,即电流引起的热不稳定性通常是在高电流密度下超导性崩溃的起源,至少在离Tc不远的温度下。

英文摘要:

Using the Green's function of the 3D heat equation, we develop an analytical account of the thermal behaviour of superconducting films subjected to electrical currents larger than their critical current in the absence of an applied magnetic field. Our model assumes homogeneity of films and current density, and besides thermal coefficients employs parameters obtained by fitting to experimental electrical field - current density characteristics at constant bath temperature. We derive both a tractable dynamic equation for the real temperature of the film up to the supercritical current density J^\ast (the lowest current density inducing transition to the normal state), and a thermal stability criterion that allows prediction of J^\ast . For two typical YBCO films, J^\ast predictions agree with observations to within 5%. These findings strongly support the hypothesis that a current-induced thermal instability is generally the origin of the breakdown of superconductivity under high electrical current densities, at least at temperatures not too far from Tc.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑