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arXiv 1111.4120physics.optics
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非成像散斑干涉法forHigh纳米级位置快速检测

Non-Imaging Speckle Interferometry forHigh Speed Nanometer-Scale Position Detection

E. G. van Putten, A. Lagendijk, A. P. Mosk

摘要:

我们实验证明了一种非成像的方法来测量复杂散射材料的位移。通过在空间上控制入射到材料上的光的波前,我们将散射光集中在指定位置的焦点上。这种波前作为一种独特的光学指纹,通过简单地测量焦点上的强度,就可以精确地检测被照射材料的位置。通过结合两个光学指纹,我们展示了沿一个维度的位移分辨率为2.1 nm的位置检测。由于我们的方法不需要散射场的图像,因此可以采用快速非成像检测器来实现散射材料的高速位置检测。

英文摘要:

We experimentally demonstrate a non-imaging approach to displacement measurement for complex scattering materials. By spatially controlling the wave front of the light that incidents on the material we concentrate the scattered light in a focus on a designated position. This wave front acts as an unique optical fingerprint that enables precise position detection of the illuminated material by simply measuring the intensity in the focus. By combining two optical fingerprints we demonstrate position detection along one dimension with a displacement resolution of 2.1 nm. As our approach does not require an image of the scattered field, it is possible to employ fast non-imaging detectors to enable high-speed position detection of scattering materials.

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