The Refractive Index of Silicon at Gamma Ray Energies

英文摘要：

The index of refraction n(E_γ)=1+δ(E_γ)+iβ(E_γ) is split into a real part δand an absorptive part β. The absorptive part has the three well-known contributions to the cross section σ_{abs}: the photo effect, the Compton effect and the pair creation, but there is also the inelastic Delbrück scattering. Second-order elastic scattering cross sections σ_{sca} with Rayleigh scattering (virtual photo effect), virtual Compton effect and Delbrück scattering (virtual pair creation) can be calculated by integrals of the Kramers-Kronig dispersion relations from the cross section σ_{abs}. The real elastic scattering amplitudes are proportional to the refractive indices δ_{photo}, δ_{Compton} and δ_{pair}. While for X-rays the negative δ_{photo} dominates, we show for the first time experimentally and theoretically that the positive δ_{pair} dominates for γrays, opening a new era of γoptics applications, i.e. of nuclear photonics.