arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1111.2946cond-mat.mes-hall
收藏

硅嵌入到graphene-SiC界面中

Silicon intercalation into the graphene-SiC interface

F. Wang, K. Shepperd, J. Hicks, M. S. Nevius, H. Tinkey, A. Tejeda, A. Taleb-Ibrahimi, F. Bertran, P. Le F`evre, D. B. Torrance, P. First, W. A. de Heer, A. A. … 展开作者

F. Wang, K. Shepperd, J. Hicks, M. S. Nevius, H. Tinkey, A. Tejeda, A. Taleb-Ibrahimi, F. Bertran, P. Le F`evre, D. B. Torrance, P. First, W. A. de Heer, A. A. Zakharov, E. H. Conrad

摘要:

在这项工作中,我们使用LEEM,XPEEM和XPS来研究在石墨烯-真空界面处的过量Si如何在高温下重新排序。我们表明,在室温下沉积在SiC(000['1])上生长的多层石墨烯薄膜上的硅在加热至1020以上的温度时迅速扩散到石墨烯-SiC界面。在一系列沉积中,我们已经能够将~ 6 ML的Si插入石墨烯-SiC界面中。

英文摘要:

In this work we use LEEM, XPEEM and XPS to study how the excess Si at the graphene-vacuum interface reorders itself at high temperatures. We show that silicon deposited at room temperature onto multilayer graphene films grown on the SiC(000[`1]) rapidly diffuses to the graphene-SiC interface when heated to temperatures above 1020. In a sequence of depositions, we have been able to intercalate ~ 6 ML of Si into the graphene-SiC interface.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑