By knowing the phase and modules of the reflection coefficient in neutron reflectometry problems, a unique result for the scattering length density (SLD) of a thin film can be determined which will lead to the exact determination of type and thickness of the film. In the past decade, several methods have been worked out to resolve the phase problem such as dwell time method, reference layer method and variation of surroundings, among which the reference method and variation of surroundings by using a magnetic substrate and polarized neutrons is of the most applicability. All of these methods are based on the solution of Schrodinger equation for a discontinuous and step-like potential at each interface. As in real sample there are some smearing and roughness at boundaries, consideration of smoothness and roughness of interfaces would affect the final output result. In this paper, we have investigated the effects of smoothness of interfaces on determination of the phase of reflection as well as the retrieval process of the SLD, by using a smooth varying function (Eckart potential). The effects of roughness of interfaces on the same parameters, have also been investigated by random variation of the interface around it mean position.
X-ray reflectometric studies of nanoparticulate hematite films to decouple the rough and smooth behaviors of it and crystallographic and morphological properties concerning fatty acid chain length
Structural peculiarities of $\varepsilon$-Fe$_2$O$_3$ / GaN epitaxial layers unveiled by high-resolution transmission electron microscopy and neutron reflectometry
采用脉冲激光沉积法在半导体GAN（0001）衬底上生长了亚稳铁氧化物（$\varepsilon$ -Fe $_2$ O $_3$）外延膜，并对其晶体学特性进行了结构研究。纳米级$\varepsilon$ -Fe $_2$ O $_3$薄膜的柱状结构已被首次使用高分辨电子显微镜（HRTEM）直接空间技术辅以倒易空间方法的高能电子衍射和彩色增强HRTEM图像傅立叶滤波。通过中子反射仪和能量色散X射线光谱法对$\varepsilon$ -Fe $_2$ O $_3$ / GAN界面形成进行了深度分辨密度和化学成分分析，进一步扩展了对界面形成的研究。研究结果揭示了位于$\varepsilon$ -Fe $_2$ O $_3$ / GAN界面的几纳米厚的低密度过渡层的性质和来源。该层的性质的详细知识被认为对于$\varepsilon$ -Fe $_2$ O $_3$ / GAN异质结构的开发是非常重要的，所述异质结构可以潜在地成为具有室温磁电耦合的基于铁氧化物的半导体上铁器件的一部分。
Structural, magnetic and superconducting characterization of the CuNi/Nb bilayers of the S/F type using Polarized Neutron Reflectometry and complementary techniques
Interfacial roughness and proximity effects in superconductor/ferromagnet CuNi/Nb heterostructures
本文报道了用磁控溅射法制备的Nb/Cu $_{60}$ Ni $_{40}$混合超导/铁磁体（S/F）双层膜的结构和电子性质。X射线和中子反射测量表明，沉积在Al $_2$ O $_3$（1 $\bar{1}$ 02）衬底上的异质结构的总界面粗糙度和不同界面粗糙度的垂直相关性都低于沉积在Si（111）衬底上的异质结构。互感实验研究了界面粗糙度对超导转变温度$T_C$的影响。这些测量结果表明，沉积在Al $_2$ O $_3$上的异质结构中的$\sim$比沉积在Si上的异质结构高$T_C$ 4%。我们将这种效应归因于S层中电子的更高平均自由程，这是由界面处的扩散散射的抑制引起的。然而，$T_C$对铁磁层厚度的依赖性在两个系统中没有显著差异，表明库珀对的透明性上的界面粗糙度的微弱影响。
Nonmagnetic impurities and roughness effects on the finite temperature magnetic properties of core-shell spherical nanoparticles
受最近研究[V. Dimitriadis et al. Phys. Rev. B \textbf{92}，064420（2015）]的启发，我们研究了具有核-壳结构的球形纳米颗粒的有限温度磁性，包括淬灭的（i）表面和（ii）界面杂质（静态孔）以及（iii）粗糙化界面效应。粒子核由铁磁自旋组成，并且它被铁磁壳包围。通过基于改进的Metropolis算法的蒙特卡罗模拟，我们实现了经典的海森堡哈密顿纳米粒子。特别注意也被致力于阐明这些系统的热和磁相变功能上的颗粒尺寸的影响。对于表面层不完整的纳米颗粒，发现较大的颗粒具有较低的补偿点，该补偿点随着空位量的增加而逐渐减小，并在某一临界值处消失。考虑到纳米粒子的稀释界面，我们的蒙特卡罗模拟结果表明，在无序谱中存在一个区域，补偿温度随稀释参数的减小而线性降低。对于具有粗糙界面的纳米颗粒，观察到粗糙度对补偿点和临界温度的变化都不起任何显著作用。然而，低温饱和磁化的核和壳界面区域敏感地依赖于粗糙度参数。
Combine Influences of Nanoparticulate Hematite Thin Film Thickness, Roughness, and Weight on Its Photoelectrochemical Performance and Viscous/ Thermal Characteristics of Source Precursor
