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arXiv 1107.0633cond-mat.mes-hall
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基于第一性原理的电流诱导势垒抑制电迁移

Current-induced energy barrier suppression for electromigration from first principles

Ruoxing Zhang, Ivan Rungger, Stefano Sanvito, Shimin Hou

摘要:

我们提出了一种有效的方法来评估纳米结中的电流感应力,它自然地集成到非平衡格林函数形式主义内实现密度泛函理论。这使我们能够在电流存在的情况下执行动态原子弛豫,同时还评估电流-电压特性。其中心思想是用格林函数表示系统的能量密度矩阵。为了验证我们的实现,我们进行了一系列的基准计算,在零和有限的偏见。首先,我们评估的电流诱导力作用在铝纳米线,并将它们与以前发表的结果固定的几何形状。然后,我们进行结构松弛下偏置相同的电线,并确定临界电压时,他们打破。我们发现,虽然一个完美的直线不会在任何考虑的电压断裂,曲折线是更脆弱的,并在1.4 V,与铝原子移动对电子流的卡扣。最后,我们证明了我们的计划,以解决电迁移问题的能力,通过研究的电流诱导运动的一个单一的Si原子共价连接到侧壁的(4,4)扶手椅单壁碳纳米管。我们的计算表明,如果硅是沿着电流路径连接,那么电流感应力可以诱导迁移。相反,如果键合位点远离电流路径,则吸附原子将保持稳定,而不管电压如何。基于将总力分解为风和静电分量以及对键电流的详细评估的分析表明,这种显著的电迁移现象仅仅是由于位置相关的风力。

英文摘要:

We present an efficient method for evaluating current-induced forces in nanoscale junctions, which naturally integrates into the non-equilibrium Green's function formalism implemented within density functional theory. This allows us to perform dynamical atomic relaxation in the presence of an electric current while also evaluating the current-voltage characteristics. The central idea consists in expressing the system energy density matrix in terms of Green's functions. In order to validate our implementation we perform a series of benchmark calculations, both at zero and finite bias. Firstly we evaluate the current-induced forces acting over an Al nanowire and compare them with previously published results for fixed geometries. Then we perform structural relaxation of the same wires under bias and determine the critical voltage at which they break. We find that, while a perfectly straight wire does not break at any of the voltages considered, a zigzag wire is more fragile and snaps at 1.4 V, with the Al atoms moving against the electron flow. Finally we demonstrate the capability of our scheme to tackle the electromigration problem by studying the current-induced motion of a single Si atom covalently attached to the sidewall of a (4,4) armchair single-walled carbon nanotube. Our calculations indicate that if Si is attached along the current path, then current-induced forces can induce migration. In contrast, if the bonding site is away from the current path, then the adatom will remain stable regardless of the voltage. An analysis based on decomposing the total force into a wind and an electrostatic component, as well as on a detailed evaluation of the bond currents, shows that this remarkable electromigration phenomenon is due solely to the position-dependent wind force.

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