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arXiv 1106.3155cond-mat.dis-nn
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绝缘颗粒铝的慢电导弛豫:屏蔽效应的证据

Slow Conductance Relaxation in Insulating Granular Al: Evidence for Screening Effects

Julien Delahaye, Jean Honoré, Thierry Grenet

摘要:

结果表明,在电场效应测量中观察到的颗粒铝膜的电导弛豫是两个贡献的总和。一个是敏感的栅极电压的变化,并给出了已经报道的异常电场效应。另一个是独立的栅极电压的历史和开始时,薄膜冷却到低温。它们的相对振幅强烈地依赖于厚度,这表明在我们的绝缘膜中存在有限的屏蔽长度,并允许其定量估计(在4K下约10nm)。在无序绝缘体的电子玻璃模型中应考虑这种类金属屏蔽。

英文摘要:

It is shown that the conductance relaxations observed in electrical field effect measurements on granular Al films are the sum of two contributions. One is sensitive to gate voltage changes and gives the already reported anomalous electrical field effect. The other one is independent of the gate voltage history and starts when the films are cooled down to low temperature. Their relative amplitude is strongly thickness dependent which demonstrates the existence of a finite screening length in our insulating films and allows its quantitative estimate (about 10nm at 4K). This metallic-like screening should be taken into account in the electron glass models of disordered insulators.

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