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arXiv 1105.5993astro-ph.CO
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最亮硬X射线窄线塞弗特1星系NGC 5506的高能辐射

High-energy emission from NGC 5506, the brightest hard X-ray Narrow Line Seyfert 1 galaxy

S. Soldi, V. Beckmann, N. Gehrels, S. De Jong, P. Lubinski

摘要:

我们目前的硬X射线发射的NGC 5506,最明亮的窄线塞弗特1星系超过20 keV的结果。分析了INTEGRAL、Swift和Suzaku最近的所有观测,并在9个不同的时间段进行了光谱分析。虽然在过去7年中检测到通量变化为2倍,但仅观察到中等光谱变化,暗示X射线光谱硬化,固有吸收随时间减少。使用朱雀观测,有可能将康普顿反射的量限制在R = 0.6-1.0,这与以前对源的结果一致。康普顿化过程的特征也可以在部分观测期间的高能量截止检测中找到,在Ec = 40-100 keV。当Comptonisation模型被应用到朱雀数据,温度和Comptonising电子等离子体的光学深度测量在kT = 60-80 keV和τ = 0.6-1.0,分别。NGC 5506在这项研究中推断的属性与基于相同AGN的其他数据集的属性一致,并且适合NLS 1在硬X射线处具有比宽线等效物更低的高能截止值的图片。

英文摘要:

We present results on the hard X-ray emission of NGC 5506, the brightest narrow line Seyfert 1 galaxy above 20 keV. All the recent observations by INTEGRAL, Swift and Suzaku have been analysed and spectral analysis during nine separated time periods has been performed. While flux variations by a factor of 2 were detected during the last 7 years, only moderate spectral variations have been observed, with the hint of a hardening of the X-ray spectrum and a decrease of the intrinsic absorption with time. Using Suzaku observations it is possible to constrain the amount of Compton reflection to R = 0.6-1.0, in agreement with previous results on the source. The signature of Comptonisation processes can also be found in the detection of a high-energy cut-off during part of the observations, at Ec = 40-100 keV. When a Comptonisation model is applied to the Suzaku data, the temperature and the optical depth of the Comptonising electron plasma are measured at kT = 60-80 keV and tau = 0.6-1.0, respectively. The properties inferred for NGC 5506 in this study agree with those based on other data sets for the same AGN, and fit the picture of NLS1 having in general lower high-energy cut-offs at hard X-rays than their broad line equivalent.

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