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arXiv 1105.2707cs.ITmath.IT
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广义对称发散测度与度量空间

Generalized Symmetric Divergence Measures and Metric Spaces

G. A. T. F. da Costa, Inder Jeet Taneja

摘要:

最近,Taneja研究了J-散度的两个单参数推广:Jensen-Shannon散度和算术-几何散度。这两个概括特别包含的措施,如:海林格歧视,对称卡方分歧,三角歧视。这些测量在统计学和信息论的文献中是众所周知的。本文的目的是证明这两个对称广义散度测度的平方根的度量空间性质。

英文摘要:

Recently, Taneja studied two one parameter generalizations of J-divergence, Jensen-Shannon divergence and Arithmetic-Geometric divergence. These two generalizations in particular contain measures like: Hellinger discrimination, symmetric chi-square divergence, and triangular discrimination. These measures are well known in the literature of Statistics and Information theory. In this paper our aim is to prove metric space properties for square root of these two symmetric generalized divergence measures.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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