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arXiv 1105.0822physics.optics
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高纯度PDMATHAAB Si、PDMATHAAC Si、PDMATHAAD Si和$^{nat}$ Si单晶的Refractive index光谱依赖性、拉曼和透射光谱

Refractive index spectral dependence, Raman and transmission spectra of high-purity $^{28}$Si, $^{29}$Si, $^{30}$Si, and $^{nat}$Si single crystals

V. G. Plotnichenko, V. O. Nazaryants, E. B. Kryukova, V. V. Koltashev, V. O. Sokolov, E. M. Dianov, A. V. Gusev, V. A. Gavva, T. V. Kotereva, M. F. Churbanov

摘要:

精确测量稳定硅同位素$^{28}$ Si、$^{29}$ Si、$^{30}$ Si单晶的折射率,其丰度大于99.9 at.%采用傅里叶变换干涉折射法对天然同位素组成的硅单晶$^{nat}$ Si进行了1.06至80 mkm以上的测量,$^{-1}$分辨率为0.1 cm,准确度为$2 \times 10^{-5} ... 1 \times 10^{-4}$。所有晶体中的氧和碳浓度均在$5 \times 10^{15}$ cm $^{-3}$范围内,金属杂质含量为$10^{-5} ... 10^{-6}$ at.%。给出了所有硅单晶声子吸收区折射率的奇特变化。给出了在整个测量范围内近似实验折射率值的广义柯西色散函数系数。研究了透射光谱和拉曼光谱。

英文摘要:

Precise measurement of the refractive index of stable silicon isotopes $^{28}$Si, $^{29}$Si, $^{30}$Si single crystals with enrichments above 99.9 at.% and a silicon single crystal $^{nat}$Si of natural isotopic composition is performed with the Fourier-transform interference refractometry method from 1.06 to more than 80 mkm with 0.1 cm$^{-1}$ resolution and accuracy of $2 \times 10^{-5} ... 1 \times 10^{-4}$. The oxygen and carbon concentrations in all crystals are within $5 \times 10^{15}$ cm$^{-3}$ and the content of metal impurities is $10^{-5} ... 10^{-6}$ at.%. The peculiar changes of the refractive index in the phonon absorption region of all silicon single crystals are shown. The coefficients of generalized Cauchy dispersion function approximating the experimental refractive index values all over the measuring range are given. The transmission and Raman spectra are also studied.

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