通过分析双缝物体的近场图像确定超透镜分辨率的鲁棒方法
Robust method to determine the resolution of a superlens by analyzing the near-field image of a two-slit object
摘要：
在过去的十年中，基于超材料的超透镜，分辨率低于阿贝衍射极限，已经出现。为了获得这种超透镜的分辨率的粗略估计，通常执行由亚波长间隙\textit{d}分开的两个亚波长狭缝的成像。透镜的分辨率$Δ$对应于最小可能间隙$d_{min}$，对于该最小可能间隙$d_{min}$，可以分辨两个狭缝的不同图像（$Δ\sim d_{min}$）。在这封信中，我们提出了一个更定量的估计制造的镜头的分辨率拟合分析近场图像的配置文件，从成像的双缝对象与已知分辨率的理论负折射率透镜，实验数据。我们总结了我们的分析方法，从文献中的超透镜的3个案例的讨论。如图所示，这种方法对于快速评估制造的超分辨率透镜的性能特别有吸引力。
英文摘要：
In the last decade, metamaterials-based superlenses, with a resolution below Abbe's diffraction limit, have emerged. To obtain a rough estimate of the resolution of such superlenses, imaging of two subwavelength slits, separated by a subwavelength gap \textit{d} is typically performed. The resolution $Δ$ of the lens corresponds to the minimum possible gap $d_{min}$ for which a distinct image of the two slits can be resolved ($Δ\sim d_{min}$). In this letter, we present a more quantitative estimate of the resolution of manufactured lenses by fitting analytical near-field image profiles, obtained from imaging a two-slit object with a theoretical negative-index lens of known resolution, to experimental data. We conclude the discussion by applying our analytical method to 3 case examples of superlensing from the literature. As shown, this method is particularly attractive for rapidly assessing the performance of fabricated superresolution lenses.
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