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arXiv 1104.1741cond-mat.softphysics.flu-dyn
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三相接触线作用下弹性基底的变形

The Deformation of an Elastic Substrate by a Three-Phase Contact Line

Elizabeth R. Jerison, Ye Xu, Larry A. Wilen, Eric R. Dufresne

摘要:

杨氏对三相接触线平衡的经典分析忽略了液-汽表面张力的面外分量。虽然长期以来人们已经认识到,这种未解决的力必须通过固体基底的弹性形变来平衡,但由于基底的传统理想化意味着接触线处的应力发散,因此确定的分析仍然是难以捉摸的。虽然已经提出了一些理论来切断分歧,但没有一个理论与实验数据相吻合。我们使用荧光共聚焦显微镜测量了三相接触线附近薄弹性膜的表面和体积变形。面外变形通过线弹性理论很好地拟合,该理论结合了由于凝胶的表面张力而引起的面外回复力。该理论预测接触线附近的变形轮廓是无标度的,并且与基底的弹性模量无关。

英文摘要:

Young's classic analysis of the equilibrium of a three-phase contact line ignores the out-of-plane component of the liquid-vapor surface tension. While it has long been appreciated that this unresolved force must be balanced by elastic deformation of the solid substrate, a definitive analysis has remained elusive because conventional idealizations of the substrate imply a divergence of stress at the contact line. While a number of theories of have been presented to cut off the divergence, none of them have provided reasonable agreement with experimental data. We measure surface and bulk deformation of a thin elastic film near a three-phase contact line using fluorescence confocal microscopy. The out-of-plane deformation is well fit by a linear elastic theory incorporating an out-of-plane restoring force due to the surface tension of the gel. This theory predicts that the deformation profile near the contact line is scale-free and independent of the substrate elastic modulus.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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