qPlus磁力显微镜在调频模式下的毫赫兹分辨率
qPlus Magnetic Force Microscopy in Frequency-Modulation Mode with milli-Hertz Resolution
摘要：
磁力显微镜（MFM）通过探测磁性探针尖端和磁性样品之间的偶极力来对铁磁样品的畴结构进行成像。样品的磁畴结构取决于单个电子自旋的原子排列。希望能够用单个探针对单个原子和域结构成像。然而，导致原子对比度的相互作用的力梯度和导致畴对比度的相互作用的力梯度是数量级分开的-从原子相互作用的高达100 N/m到磁偶极子相互作用的0.0001 N/m。在这里，我们表明，这个差距可以用qPlus传感器桥接，其刚度为1800 N/m（针对原子相互作用进行了优化），其灵敏度足以测量磁偶极-偶极相互作用引起的毫赫兹频率对比度。因此，我们已经成功地建立了一个传感技术，执行扫描隧道显微镜，原子力显微镜和MFM与一个单一的探针。
英文摘要：
Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. The magnetic domain structure of the sample depends on the atomic arrangement of individual electron spins. It is desirable to be able to image both individual atoms and domain structures with a single probe. However, the force gradients of the interactions responsible for atomic contrast and those causing domain contrast are orders of magnitude apart - ranging from up to 100N/m for atomic interactions down to 0.0001N/m for magnetic dipole interactions. Here, we show that this gap can be bridged with a qPlus sensor, with a stiffness of 1800N/m (optimized for atomic interaction), that is sensitive enough to measure milli-Hertz frequency contrast caused by magnetic dipole-dipole interactions. Thus we have succeeded to establish a sensing technique that performs Scanning Tunneling Microscopy, Atomic Force Microscopy and MFM with a single probe.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
