单端口S和SLO校准VNA测量中DER误差估计的比较及应用
Comparison of Error Estimations by DERs in One-Port S and SLO Calibrated VNA Measurements and Application
摘要：
为了证明矢量网络分析中系统误差估计的唯一现有方法的有效性（矢量网络分析仪）测量通过使用复杂的DER（差分误差区域），我们比较了采用两种著名校准技术后的单端口VNA测量结果：快速反射响应，仅使用单个S（短路）标准，以及耗时的全单端口，即使用三重SLO标准（短路、匹配负载、开路）。对于这两种校准技术，比较涉及：（a）VNA读数和测量值之间差异的3D几何表示，以及（b）反射系数的DER及其极性DEI（差分误差区间）以及相应输入阻抗的DER及其矩形DEI的许多表示图。在本文中，我们提出了这种方法的应用AUT（天线测试）选择突出存在的实际情况下，耗时的校准技术的结果系统误差估计条纹，包括几乎所有的快速校准。
英文摘要：
In order to demonstrate the usefulness of the only one existing method for systematic error estimations in VNA (Vector Network Analyzer) measurements by using complex DERs (Differential Error Regions), we compare one-port VNA measurements after the two well-known calibration techniques: the quick reflection response, that uses only a single S (Short circuit) standard, and the time-consuming full one-port, that uses a triple of SLO standards (Short circuit, matching Load, Open circuit). For both calibration techniques, the comparison concerns: (a) a 3D geometric representation of the difference between VNA readings and measurements, and (b) a number of presentation figures for the DERs and their polar DEIs (Differential Error Intervals) of the reflection coefficient, as well as, the DERs and their rectangular DEIs of the corresponding input impedance. In this paper, we present the application of this method to an AUT (Antenna Under Test) selected to highlight the existence of practical cases in which the time consuming calibration technique results a systematic error estimation stripe including almost all of that of quick calibration.
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