悬浮石墨烯的低能电子点投影显微镜，最终的“显微镜载玻片”
Low Energy Electron Point Projection Microscopy of Suspended Graphene, the Ultimate "Microscope Slide"
摘要：
点投影显微术（PPM）用于使用低能电子（100- 200 eV）对悬浮的石墨烯进行成像。由于使用的能量低，石墨烯既不会被电子束损坏也不会被污染。石墨烯的透明度测量值为74%，相当于电子通过sp^2键合碳共价半径两倍厚的薄片的透射率。还观察到悬浮石墨烯结构中的波纹，波长约为26 nm。观察到由于石墨烯刀刃的边缘的衍射引起的电子束的干涉，并将其用于计算电子发射器的4.7 +/-0.6埃的虚源尺寸。它表明，石墨烯可以被用作阳极和衬底PPM，以避免由于强场梯度周围的纳米尺度的物体的失真。石墨烯可以用来成像物体悬浮在纸张上使用PPM，并在未来，电子全息。
英文摘要：
Point Projection Microscopy (PPM) is used to image suspended graphene using low-energy electrons (100-200eV). Because of the low energies used, the graphene is neither damaged or contaminated by the electron beam. The transparency of graphene is measured to be 74%, equivalent to electron transmission through a sheet as thick as twice the covalent radius of sp^2-bonded carbon. Also observed is rippling in the structure of the suspended graphene, with a wavelength of approximately 26 nm. The interference of the electron beam due to the diffraction off the edge of a graphene knife edge is observed and used to calculate a virtual source size of 4.7 +/- 0.6 Angstroms for the electron emitter. It is demonstrated that graphene can be used as both anode and substrate in PPM in order to avoid distortions due to strong field gradients around nano-scale objects. Graphene can be used to image objects suspended on the sheet using PPM, and in the future, electron holography.
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