受抑Total Internal Reflection：微波区的共振和负Goos-Hänchen位移
Frustrated Total Internal Reflection: Resonant and Negative Goos-Hänchen Shifts in Microwave Regime
摘要：
在全内反射情况下，Goos-Hänchen位移（GHS）的变化与倏逝态提供的能量通量密切相关。然而，当用聚甲基丙烯酸甲酯（PMMA）双棱镜系统实现受抑内全反射（FTIR）时，在8.2 ~ 12.4 GHz的微波频率范围内，我们观察到反射光束的GH位移随工作频率或空气层厚度的变化呈现周期性共振，这与相应的反射能量的变化不同。此外，在另一个基于傅里叶变换红外光谱的系统中，由一个复合吸收材料板与一个二维的频率选择表面（FSS）的顶层引入，被发现的GHS反射光束不仅是共振的，而且是负的横向电场的入射是TE极化。
英文摘要：
It is well-known that the variations of Goos-Hänchen shifts (GHSs) are closely associated with the enengy-flux provided by evanescent states in the case of total internal reflection. However, when the frustrated internal total reflection (FTIR) is realized with a Polymethyl Methacrylate (PMMA) double-prism system operated in the microwave frequency range of 8.2 GHz to 12.4 GHz, we observe that the GH shifts for the reflected beam show periodic resonances with varying the operation frequency or the air layer thickness, which is different from the variation of the corresponding reflected energy. Moreover, in another FTIR based system introduced by a composite absorptive material slab with a two-dimensional top layer of frequency selective surface (FSS), the GHSs for reflected beam are discovered as not only resonant but also negative with the incidence of transverse electric that is TE polarized.
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