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arXiv 1005.5364cond-mat.mtrl-sci
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反射高能电子衍射的结构分析可能性

The Structural Analysis Possibilities of Reflection High Energy Electron Diffraction

N. J. C. Ingle, A. Yuskauskas, R. Wicks, M. Paul, S. Leung

摘要:

复合氧化物薄膜的外延生长提供了三种产生独特性质的途径:影响膜的三维结构的能力、表面的存在和界面的产生。在所有这三种情况下,都需要清楚地了解所得到的原子结构。然而,确定外延薄膜的完整结构(晶格参数,空间群,原子位置,表面重建)的常规基础上是一个严峻的挑战。在本文中,我们突出了显着的信息,可以从布拉格散射和非弹性多次散射事件发生在反射高能电子衍射。我们回顾了一些方法来提取结构信息,并展示了如何在其他领域中使用的成熟技术可以直接应用到{ \em原位}和实时衍射图像的生长膜。这些技术的集合提供了对薄膜的受外延影响的三维体结构以及可能发生在表面的任何重建的访问。

英文摘要:

The epitaxial growth of complex oxide thin films provide three avenues to generate unique properties: the ability to influence the 3-dimensional structure of the film, the presence of a surface, and the generation of an interface. In all three cases, a clear understanding of the resulting atomic structure is desirable. However, determining the full structure of an epitaxial thin film (lattice parameters, space group, atomic positions, surface reconstructions) on a routine basis is a serious challenge. In this paper we highlight the remarkable information that can be extracted from both the Bragg scattering and inelastic multiple scattering events that occur during Reflection High Energy Electron Diffraction. We review some methods to extract structural information and show how mature techniques used in other fields can be directly applied to the {\em in-situ} and real-time diffraction images of a growing film. These collection of techniques give access to both the epitaxially influenced 3 dimensional bulk structure of the film, and any reconstructions that may happen at the surface.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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