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基于核估计的自适应错误发现率控制过程的渐近结果

Asymptotic Results on Adaptive False Discovery Rate Controlling Procedures Based on Kernel Estimators

Pierre Neuvial

摘要:

错误发现率(FDR)是多测试问题中常用的I类差错率。它被定义为预期的假发现比例(FDP),即被拒绝的假设中假阳性的预期比例。当假设是独立的,Benjamini-Hochberg程序实现FDR控制在任何预先指定的水平。通过构造,FDR控制在功率或II类误差方面不提供保证。已经开发了一些替代程序,包括插件程序,旨在通过纳入真实零假设的比例估计来获得功率。在本文中,我们研究的渐近行为的一类插件程序的基础上的核估计的密度的$p$ -值,作为数量$m$的测试假设增长到无穷大。在一个设置的假设测试是独立的,我们证明,这些程序是渐近更强大的两个方面:(i)一个更严格的渐近FDR控制的任何目标FDR水平和(ii)更广泛的目标水平产生积极的渐近功率。我们还表明,这种增加的渐近功率是以较慢的价格,非参数收敛速度的FDP。这些比率的形式为$m^{-k/(2k+1)}$,其中$k$由$p$值分布的密度的规律性确定,或等效地由检验统计量分布的密度的规律性确定。这些结果适用于单侧和双侧检验统计的高斯和拉普拉斯位置模型,并为学生模型。

英文摘要:

The False Discovery Rate (FDR) is a commonly used type I error rate in multiple testing problems. It is defined as the expected False Discovery Proportion (FDP), that is, the expected fraction of false positives among rejected hypotheses. When the hypotheses are independent, the Benjamini-Hochberg procedure achieves FDR control at any pre-specified level. By construction, FDR control offers no guarantee in terms of power, or type II error. A number of alternative procedures have been developed, including plug-in procedures that aim at gaining power by incorporating an estimate of the proportion of true null hypotheses. In this paper, we study the asymptotic behavior of a class of plug-in procedures based on kernel estimators of the density of the $p$-values, as the number $m$ of tested hypotheses grows to infinity. In a setting where the hypotheses tested are independent, we prove that these procedures are asymptotically more powerful in two respects: (i) a tighter asymptotic FDR control for any target FDR level and (ii) a broader range of target levels yielding positive asymptotic power. We also show that this increased asymptotic power comes at the price of slower, non-parametric convergence rates for the FDP. These rates are of the form $m^{-k/(2k+1)}$, where $k$ is determined by the regularity of the density of the $p$-value distribution, or, equivalently, of the test statistics distribution. These results are applied to one- and two-sided tests statistics for Gaussian and Laplace location models, and for the Student model.

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