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arXiv 1002.5035cond-mat.mes-hall
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Simulation of the Spin Field Effect Transistors: Effects of Tunneling and Spin Relaxation on its Performance

Yunfei Gao, Tony Low, Mark S. Lundstrom, Dmitri E. Nikonov

英文摘要:

A numerical simulation of spin-dependent quantum transport for a spin field effect transistor (spinFET) is implemented in a widely used simulator nanoMOS. This method includes the effect of both spin relaxation in the channel and the tunneling barrier between the source/drain and the channel. Account for these factors permits setting more realistic performance limits for the transistor, especially the magnetoresistance, which is found to be lower compared to earlier predictions. The interplay between tunneling and spin relaxation is elucidated by numerical simulation. Insertion of the tunneling barrier leads to an increased magnetoresistance. Numerical simulations are used to explore the tunneling barrier design issues.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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