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arXiv 1002.3812quant-ph
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用于光学各向异性测量的高灵敏度频率计量学

Highly sensitive frequency metrology for optical anisotropy measurements

Gilles Bailly, Raphaël Thon, Cécile Robilliard

摘要:

在本文中,我们提出了一种新的装置,旨在测量非常小的双折射和各向异性,频率计量学的基础上,而不是像往常一样偏振。在我们的实验中,一个非常高的精细度谐振腔被用来将相位差转换成谐振频率差,然后可以非常高的精度测量。我们描述的设置和呈现的实验测试,表现出灵敏度DN ~ 2 × 10?18,允许测量长期预测的气体中的磁电光效应。由于我们的设备的散粒噪声有限的灵敏度远低于国家的最先进的灵敏度,频率计量出现作为一个有前途的小双折射测量技术。

英文摘要:

In this paper we present a novel apparatus aimed at measuring very small birefringences and anisotropies, based on frequency metrology and not on polarimetry as usual. In our experiment, a very high finesse resonant cavity is used to convert the phase difference into a resonance frequency difference, which can then be measured with very high accuracy. We describe the set-up and present the results of experimental tests which exhibited a sensitivity dn ~ 2 x 10?18, allowing for the measurement of long-predicted magneto-electro-optical effects in gases. Since the shotnoise limited sensitivity of our apparatus lies well below the state-of-the-art sensitivity, frequency metrology appears as a promising technique for small birefringence measurements.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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