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arXiv 0910.5356cond-mat.mes-hall
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太赫兹量子级联探测器中的界面粗糙度输运

Interface roughness transport in THz quantum cascade detectors

Emmanuel Lhuillier, Isabelle Ribet-Mohamed, Emmanuel Rosencher, Gilles Patriarche, Amandine Buffaz, Vincent Berger, Mathieu Carras

摘要:

基于量子级联的红外探测器已经被提出来抑制暗电流,暗电流被认为是量子阱红外探测器中的限制因素。这些探测器主要设计用于3- 5 um和8- 12 um的波长范围。对于在THz范围内操作的探测器,预期传输状态的完全改变,因为光子能量低于纵向光学(LO)声子能量。使用二维码的运输,我们已经确定界面粗糙度(IR)的关键相互作用,在这样的结构。我们已经使用扫描透射电子显微镜(STEM)来评估IR参数(粗糙度和缺陷之间的平均距离的大小),而不是经典的迁移率测量。最后,我们使用这些参数来研究它们对器件电阻的影响。

英文摘要:

Infrared Detectors based on a Quantum Cascade have been proposed to suppress the dark current which is identified as a limiting factor in Quantum Well Infrared Photodetectors. Those detectors have been mostly designed for the 3-5um and 8-12um range of wavelength. For detector operating in the THz range a complete change of regime of transport is expected since the photon energy is lower than the Longitudinal Optical (LO) phonon energy. Using a two dimensional code of transport we have identified Interface Roughness (IR) as the key interaction in such a structure. We have used scanning transmission electron microscopy (STEM) to evaluate the IR parameters (magnitude of the roughness and mean distance between defects) instead of the classical mobility measurements. Finally, we used these parameters to study their influence on the resistance of the device.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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