理解Kelvin探针力显微镜中的原子尺度对比度
Understanding the atomic-scale contrast in Kelvin Probe Force Microscopy
摘要：
对开尔文探针力显微镜（KPFM）中原子尺度对比度的来源进行了数值分析。原子模拟的尖端-样品相互作用力场已结合非接触式原子力显微镜/KPFM模拟器。该实施方案模拟了最近的实验结果上的（001）表面的大块碱金属卤化物晶体，同时原子尺度的地形和接触电势差（CPD）的对比报告。局部CPD确实反映了离子晶体的周期性，但不是其马德隆表面电位的大小。成像机制依赖于由于所施加的偏置电压的调制而引起的尖端-表面界面处的离子的诱导极化。我们的研究结果与以前的理论预期和实验观察非常一致。
英文摘要：
A numerical analysis of the origin of the atomic-scale contrast in Kelvin probe force microscopy (KPFM) is presented. Atomistic simulations of the tip-sample interaction force field have been combined with a non-contact Atomic Force Microscope/KPFM simulator. The implementation mimics recent experimental results on the (001) surface of a bulk alkali halide crystal for which simultaneous atomic-scale topographical and Contact Potential Difference (CPD) contrasts were reported. The local CPD does reflect the periodicity of the ionic crystal, but not the magnitude of its Madelung surface potential. The imaging mechanism relies on the induced polarization of the ions at the tip-surface interface owing to the modulation of the applied bias voltage. Our findings are in excellent agreement with previous theoretical expectations and experimental observations.
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