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arXiv 0907.3579cond-mat.mtrl-sci

Electric breakdown in ultra-thin MgO tunnel barrier junctions for spin-transfer torque switching

M. Schäfers, V. Drewello, G. Reiss, A. Thomas, K. Thiel, G. Eilers, M. Münzenberg, H. Schuhmann, M. Seibt

英文摘要:

Magnetic tunnel junctions for spin-transfer torque switching were prepared to investigate the dielectric breakdown. The breakdown occurs typically at voltages not much higher than the switching voltages, a bottleneck for the implementation of spin-transfer torque Magnetic Random Access Memory. Intact and broken tunnel junctions are characterized by transport measurements and then prepared for transmission electron microscopy and energy dispersive x-ray spectrometry by focussed ion beam. The comparison to our previous model of the electric breakdown for thicker MgO tunnel barriers reveals significant differences arising from the high current densities.

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