利用半导体特性制造硬件木马
Exploiting Semiconductor Properties for Hardware Trojans
摘要：
本文讨论了在CMOS代工制造过程中可能引入的隐藏的可靠性缺陷，可能会导致加速磨损的设备。这些隐藏的缺陷或硬件木马可以通过偏离代工厂设计规则和工艺参数来创建。特洛伊木马是通过利用基于时间的磨损机制（HCI，NBTI，TDDB和EM）和/或基于条件的触发器（ESD，Latchup和Softror）产生的。由于其逐渐退化的性质，这类潜在损坏难以测试。本文介绍了各种特洛伊木马引起的情况下的预期寿命的结果。半导体性能，工艺和设计参数的关键设备的可靠性和木马创建进行了讨论。
英文摘要：
This paper discusses the possible introduction of hidden reliability defects during CMOS foundry fabrication processes that may lead to accelerated wearout of the devices. These hidden defects or hardware Trojans can be created by deviation from foundry design rules and processing parameters. The Trojans are produced by exploiting time-based wearing mechanisms (HCI, NBTI, TDDB and EM) and/or condition-based triggers (ESD, Latchup and Softerror). This class of latent damage is difficult to test due to its gradual degradation nature. The paper describes life-time expectancy results for various Trojan induced scenarios. Semiconductor properties, processing and design parameters critical for device reliability and Trojan creation are discussed.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
