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arXiv 0906.3294cond-mat.supr-conquant-ph
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Josephson电荷量子比特的时间最优性能:过程层析成像方法

Time-optimal performance of Josephson charge qubits: A process tomography approach

Robert Roloff, Walter Pötz

摘要:

利用一种基于过程层析成像的开放量子系统优化方案,确定了约瑟夫森电荷量子比特在现有实验手段下的性能极限。量子比特微观建模为一个开放量子系统,考虑到状态泄漏,以及环境诱导的退相的基础上实验噪声谱。在时间最优控制理论中,我们证明了抑制状态泄漏和失相的竞争要求可以通过有效的量子位环境相互作用的外部控制来满足,在典型的实验条件下产生最小的$ΔF \approx 10^{-3}$左右的门保真度损失。

英文摘要:

A process tomography based optimization scheme for open quantum systems is used to determine the performance limits of Josephson charge qubits within current experimental means. The qubit is modeled microscopically as an open quantum system taking into account state leakage, as well as environment-induced dephasing based on experimental noise spectra. Within time-optimal control theory, we show that the competing requirements for suppression of state leakage and dephasing can be met by an external control of the effective qubit-environment interaction, yielding minimal gate fidelity losses of around $ΔF \approx 10^{-3}$ under typical experimental conditions.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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