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arXiv 0906.2840cond-mat.mtrl-sci
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低温分子束外延生长全Heusler合金Co $_{2}$ FeSi

Epitaxial Growth of a Full-Heusler Alloy Co$_{2}$FeSi on Silicon by Low-Temperature Molecular Beam Epitaxy

S. Yamada, K. Yamamoto, K. Ueda, Y. Ando, K. Hamaya, T. Sadoh, M. Miyao

摘要:

为了实现硅中自旋极化电子的电注入和探测,我们采用低温分子束外延(LTMBE)技术在硅衬底上高度外延生长了铁磁全Heusler合金Co2FeSi薄膜。虽然原位反射高能电子衍射图像清楚地显示了生长温度为60、130和200 ℃时的二维外延生长,但横截面透射电子显微镜实验表明,在生长温度为130和200 ℃时,在Co_2FeSi与Si的界面附近存在Heusler合金以外的单晶相。另一方面,当T_G = 60 C时,获得了几乎完美的异质界面.这些结果和磁性测量表明,只有在T_G = 60 C时,才能在Si上高度外延生长Co_2FeSi薄膜。

英文摘要:

For electrical spin injection and detection of spin-polarized electrons in silicon, we explore highly epitaxial growth of ferromagnetic full-Heusler-alloy Co2FeSi thin films on silicon substrates using low-temperature molecular beam epitaxy (LTMBE). Although in-situ reflection high energy electron diffraction images clearly show two-dimensional epitaxial growth for growth temperatures T_G of 60, 130, and 200 C, cross-sectional transmission electron microscopy experiments reveal that there are single-crystal phases other than Heusler alloys near the interface between Co_2FeSi and Si for T_G = 130 and 200 C. On the other hand, almost perfect heterointerfaces are achieved for T_G = 60 C. These results and magnetic measurements indicate that highly epitaxial growth of Co_2FeSi thin films on Si is demonstrated only for T_G = 60 C.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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