厚CZT探测器的漏电流和电容
Leakage Currents and Capacitances of Thick CZT Detectors
摘要：
碲锌镉（CZT）探测器的质量正在稳步提高。对于现有技术的探测器，读出噪声因此成为整体能量分辨率的越来越重要的因素。在这方面的贡献，我们提出了测量和计算的暗电流和电容的0.5厘米厚的CZT探测器接触的单片阴极和8x8阳极像素的表面上的2厘米× 2厘米。以美国布鲁克海文国家实验室的NCI ASIC芯片为例，估计了由暗电流和电容引起的读出噪声。此外，我们还讨论了像素-像素和像素-阴极噪声耦合可能引起的额外读出噪声。
英文摘要：
The quality of Cadmium Zinc Telluride (CZT) detectors is steadily improving. For state of the art detectors, readout noise is thus becoming an increasingly important factor for the overall energy resolution. In this contribution, we present measurements and calculations of the dark currents and capacitances of 0.5 cm-thick CZT detectors contacted with a monolithic cathode and 8x8 anode pixels on a surface of 2 cm x 2 cm. Using the NCI ASIC from Brookhaven National Laboratory as an example, we estimate the readout noise caused by the dark currents and capacitances. Furthermore, we discuss possible additional readout noise caused by pixel-pixel and pixel-cathode noise coupling.
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