单极电阻开关中复位开关电压的可预测性
Predictability of reset switching voltages in unipolar resistance switching
摘要：
在NiO电容器的单极电阻开关中，导电通道中的焦耳热会导致低阻态电流-电压（I-V）曲线的强非线性。由于导电沟道的非线性性质，复位电流IR可以缩放到I-V曲线的非线性系数Bo。这种比例关系可用于预测复位电压，与NiO电容器尺寸无关;它也可应用于TiO 2和FeOy电容器。利用这种关系，我们开发了一种纠错方案，以提供一个明确的窗口，分离复位和设置电压在存储器操作。
英文摘要：
In unipolar resistance switching of NiO capacitors, Joule heating in the conducting channels should cause a strong nonlinearity in the low resistance state current-voltage (I-V) curves. Due to the percolating nature of the conducting channels, the reset current IR, can be scaled to the nonlinear coefficient Bo of the I-V curves. This scaling relationship can be used to predict reset voltages, independent of NiO capacitor size; it can also be applied to TiO2 and FeOy capacitors. Using this relation, we developed an error correction scheme to provide a clear window for separating reset and set voltages in memory operations.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
