多畴Pb（Zr0.45 Ti 0.55）O3薄膜中由于180畴壁钉扎导致的介电老化的证据
Evidence for dielectric aging due to progressive 180 domain wall pinning in polydomain Pb(Zr0.45Ti0.55)O3 thin films
摘要：
多畴Pb（Zr0.45Ti0.55）O3薄膜的介电老化是由180畴壁的渐进钉扎控制的。为了提供这样一个结论，我们使用一个通用的方法，这是基于研究的时间演化的非线性，但无滞后，介电响应的铁电体的弱电场。建立了铁电系统的热力学模型，其中介电响应由钉扎180畴壁的弯曲运动控制。在这个模型中，铁电体的非线性介电常数被表示为域图案的微结构参数的函数。结果表明，使用的非线性介电常数的时间演化的分析，它是可能的，以估计在多畴钙钛矿铁电体中的老化过程中的180畴壁的运动阻止钉扎中心的浓度的变化。
英文摘要：
An evidence that the dielectric ageing in the polydomain Pb(Zr0.45Ti0.55)O3 thin films is controlled by progressive pinning of 180 domain walls is presented. To provide such a conclusion, we use a general method, which is based on the study of the time evolution of the nonlinear, but anhysteretic, dielectric response of the ferroelectric to a weak electric field. A thermodynamic model of the ferroelectric system where the dielectric response is controlled by bending movements of pinned 180 domain walls is developed. Within this model, the nonlinear permittivity of the ferroelectric is expressed as a function of the microstructural parameters of the domain pattern. It is shown that using the analysis of the time evolution of the nonlinear permittivity, it is possible to estimate changes in the concentration of the pinning centers that block the movements of the 180 domain walls during aging in polydomain perovskite ferroelectrics.
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