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arXiv 0808.0465cond-mat.mes-hall
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原位降低GaAs/AlGaAs肖特基门控器件中的电荷噪声

In situ reduction of charge noise in GaAs/AlGaAs Schottky-gated devices

Christo Buizert, Frank H. L. Koppens, Michel Pioro-Ladriere, Hans-Peter Tranitz, Ivo T. Vink, Seigo Tarucha, Werner Wegscheider, Lieven M. K. Vandersypen

摘要:

我们发现,绝缘静电门可以用来强烈抑制无处不在的背景电荷噪声肖特基栅GaAs/AlGaAs器件。通过一个2-D自洽模拟的导带分布,我们表明,这一观察结果可以解释为减少泄漏的电子从肖特基栅极到半导体通过肖特基势垒,符合“偏置冷却”的效果。在噪声降低时,噪声功率谱通常从洛伦兹型变为$1/f$型。通过比较不同Al含量的晶片,我们排除了DX中心在电荷噪声中起主导作用。

英文摘要:

We show that an insulated electrostatic gate can be used to strongly suppress ubiquitous background charge noise in Schottky-gated GaAs/AlGaAs devices. Via a 2-D self-consistent simulation of the conduction band profile we show that this observation can be explained by reduced leakage of electrons from the Schottky gates into the semiconductor through the Schottky barrier, consistent with the effect of "bias cooling". Upon noise reduction, the noise power spectrum generally changes from Lorentzian to $1/f$ type. By comparing wafers with different Al content, we exclude that DX centers play a dominant role in the charge noise.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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