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arXiv 0807.2401cond-mat.supr-con
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II型超导体中磁通涡旋的透射电子显微镜成像

Imaging Flux Vortices in Type II Superconductors with a Commercial Transmission Electron Microscope

J. C. Loudon, P. A. Midgley

摘要:

超导体中的磁通涡旋可以用透射电子显微镜成像,因为电子束被与涡旋相关的磁通量偏转。该技术具有比许多其他成像技术更好的空间和时间分辨率,并且对每个涡旋内的磁通量密度敏感,而不仅仅是样品表面处的场。尽管有这些优点,但只有两个小组成功地使用了专门改装的仪器。在这里,我们证明,涡流可以成像与现代,商业的电子显微镜在300千伏工作配备了场发射枪,洛伦兹透镜和液氦冷却的样品架。我们为非专业人士介绍超导性,并讨论模拟和优化磁通涡旋图像的技术。详细讨论了样品制备,因为要求样品具有非常大(> 10 μ m)的平坦区域,使得图像不受衍射对比度的支配是该技术的主要困难。我们对Bi_2Sr_2CaCu_2O_(8 +d)超导体中的涡旋进行了成像,并利用关联函数研究了涡旋随外加磁场的变化规律。

英文摘要:

Flux vortices in superconductors can be imaged using transmission electron microscopy because the electron beam is deflected by the magnetic flux associated with the vortices. This technique has a better spatial and temporal resolution than many other imaging techniques and is sensitive to the magnetic flux density within each vortex not simply the fields at the sample surface. Despite these advantages, only two groups have successfully employed the technique using specially adapted instruments. Here we demonstrate that vortices can be imaged with a modern, commercial transmission electron microscope operating at 300 kV equipped with a field emission gun, Lorentz lens and a liquid helium cooled sample holder. We introduce superconductivity for non-specialists and discuss techniques for simulating and optimising images of flux vortices. Sample preparation is discussed in detail as the requirement for samples with very large (>10um), flat areas so that the image is not dominated by diffraction contrast is the main difficulty with the technique. We have imaged vortices in superconducting Bi2Sr2CaCu2O8+d and use correlation functions to investigate the ordered arrangements they adopt as a function of applied magnetic field.

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