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arXiv 0803.0969cond-mat.supr-concond-mat.str-el
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YBa $_2$ Cu PDMATHAAB O $_{7-δ}$单晶和薄膜的普适临界行为

Universal critical behavior in single crystals and films of YBa$_2$Cu$_3$O$_{7-δ}$

Hua Xu, Su Li, M. C. Sullivan, Kouji Segawa, Steven M. Anlage, Yoichi Ando, C. J. Lobb

摘要:

我们用不同的样品和技术研究了最佳掺杂的$_2$ O $_{7-δ}$在零外磁场中的正常到超导相变。使用直流传输测量,我们发现,动态临界指数$z=1.54\pm0.14$,和静态临界指数$ν=0.66\pm0.10$为两个薄膜(当有限厚度的影响包括在数据分析)和单晶(其中有限厚度的影响是不重要的)。我们还测量了不同微波频率和不同功率下的薄膜,这使我们能够系统地探测不同的长度尺度,以避免有限厚度效应。还对微波实验中使用的膜进行了DC传输测量,以提供进一步的一致性检查。这些微波和DC测量产生的z值与其他结果$z=1.55\pm0.15$一致。忽略有限厚度、有限电流和有限频率效应可能是文献中先前报道的$ν$和$z$值范围较宽的原因。

英文摘要:

We have studied the normal-to-superconducting phase transition in optimally-doped YBa$_2$Cu$_3$O$_{7-δ}$ in zero external magnetic field using a variety of different samples and techniques. Using DC transport measurements, we find that the dynamical critical exponent $z=1.54\pm0.14$, and the static critical exponent $ν=0.66\pm0.10$ for both films (when finite-thickness effects are included in the data analysis) and single crystals (where finite-thickness effects are unimportant). We also measured thin films at different microwave frequencies and at different powers, which allowed us to systematically probe different length scales to avoid finite-thickness effects. DC transport measurements were also performed on the films used in the microwave experiments to provide a further consistency check. These microwave and DC measurements yielded a value of z consistent with the other results, $z=1.55\pm0.15$. The neglect of finite-thickness, finite-current, and finite-frequency effects may account for the wide ranges of values for $ν$ and $z$ previously reported in the literature.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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