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arXiv 0801.0673cond-mat.mtrl-scicond-mat.mes-hall

Valence band orbital polarization in III-V ferromagnetic semiconductors

A. A. Freeman, K. W. Edmonds, G. van der Laan, R. P. Campion, N. R. S. Farley, A. W. Rushforth, T. K. Johal, C. T. Foxon, B. L. Gallagher, A. Rogalev, F. Wilhelm

英文摘要:

The element-specific technique of x-ray magnetic circular dichroism (XMCD) is used to directly determine the magnitude and character of the valence band orbital magnetic moments in (III,Mn)As ferromagnetic semiconductors. A distinct dichroism is observed at the As K absorption edge, yielding an As 4p orbital magnetic moment of around -0.1 Bohr magnetons per valence band hole. This is strongly influenced by strain, indicating its crucial influence on the magnetic anisotropy. The dichroism at the Ga K edge is much weaker. The K edge XMCD signals for Mn and As both have positive sign, which indicates the important contribution of Mn 4p states to the Mn K edge spectra.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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