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arXiv 0710.4750cs.ITmath.IT
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高可靠存储器中抗瞬时/永久故障的Reed Solomon编码分析

On the Analysis of Reed Solomon Coding for Resilience to Transient/Permanent Faults in Highly Reliable Memories

L. Schiano, M. Ottavi, F. Lombardi, S. Pontarelli, A. Salsano

摘要:

单粒子翻转(SEU)以及永久性故障可以显著影响数字系统(如存储器和微处理器)的正确在线操作;通过使用模块化冗余和编码,可以使存储器对永久性和瞬时故障具有弹性。在本文中,不同的内存系统进行了比较:这些系统利用单工和双工安排与里德所罗门编码和擦洗的组合。的存储器系统和他们的操作进行了分析,由新的马尔可夫链的动态重构以及错误检测和纠正下发生永久性和瞬时性故障的性能进行表征。对于特定的Reed Solomon码,双工布置允许有效地应对永久性故障的发生,而擦洗的使用允许应对瞬时故障。

英文摘要:

Single Event Upsets (SEU) as well as permanent faults can significantly affect the correct on-line operation of digital systems, such as memories and microprocessors; a memory can be made resilient to permanent and transient faults by using modular redundancy and coding. In this paper, different memory systems are compared: these systems utilize simplex and duplex arrangements with a combination of Reed Solomon coding and scrubbing. The memory systems and their operations are analyzed by novel Markov chains to characterize performance for dynamic reconfiguration as well as error detection and correction under the occurrence of permanent and transient faults. For a specific Reed Solomon code, the duplex arrangement allows to efficiently cope with the occurrence of permanent faults, while the use of scrubbing allows to cope with transient faults.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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