一种分布式小型嵌入式SRAM的快速诊断方案
A Fast Diagnosis Scheme for Distributed Small Embedded SRAMs
摘要：
针对分布式小型嵌入式SRAM（e-SRAM）的故障诊断问题，提出了一种缩短诊断时间的诊断方案。该方案改进了[A parallel built-in self-diagnosis method for embedded memory buffers，A parallel built-in self-diagnosis method for embedded memory array]中提出的方案。这些改进主要有两个方面。一方面，在[A parallel built-in self-diagnosis method for embedded memory buffers，A parallel built-in self-diagnosis method for embedded memory arrays]中的诊断架构所忽略的耗时数据保留故障（DRF）的诊断现在被考虑并且经由被称为“无写恢复测试模式（NWRTM）"的DFT技术来执行。另一方面，利用包括串行到并行转换器（SPC）和并行到串行转换器（PSC）的对来代替双向串行接口，以避免串行故障掩蔽和缺陷率相关诊断的问题。从我们的评估结果表明，所提出的诊断方案实现了增加的诊断覆盖率，减少诊断时间相比，在[并行内置的自诊断方法嵌入式存储器缓冲区，并行内置的自诊断方法嵌入式存储器阵列]，与可忽略的额外面积成本。
英文摘要：
This paper proposes a diagnosis scheme aimed at reducing diagnosis time of distributed small embedded SRAMs (e-SRAMs). This scheme improves the one proposed in [A parallel built-in self-diagnostic method for embedded memory buffers, A parallel built-in self-diagnostic method for embedded memory arrays]. The improvements are mainly two-fold. On one hand, the diagnosis of time-consuming Data Retention Faults (DRFs), which is neglected by the diagnosis architecture in [A parallel built-in self-diagnostic method for embedded memory buffers, A parallel built-in self-diagnostic method for embedded memory arrays], is now considered and performed via a DFT technique referred to as the "No Write Recovery Test Mode (NWRTM)". On the other hand, a pair comprising a Serial to Parallel Converter (SPC) and a Parallel to Serial Converter (PSC) is utilized to replace the bi-directional serial interface, to avoid the problems of serial fault masking and defect rate dependent diagnosis. Results from our evaluations show that the proposed diagnosis scheme achieves an increased diagnosis coverage and reduces diagnosis time compared to those obtained in [A parallel built-in self-diagnostic method for embedded memory buffers, A parallel built-in self-diagnostic method for embedded memory arrays], with neglectable extra area cost.
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