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arXiv 0708.4148cond-mat.mtrl-scicond-mat.stat-mech
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Si(111)和Si(001)上超薄Ag膜的电子和晶格结构

Electron and lattice structure of ultra thin Ag films on Si(111) and Si(001)

V. A. Gasparov, M. Riehl-Chudoba

摘要:

为了获得金属薄膜,我们研究了低温(T<130 K)在Si同质外延制备的Si(001)和Si(111)平面上生长Ag。用XPS、UPS、LEED、STM和STS等方法研究了Ag覆盖层的能带结构和形貌。令人惊讶的是,在低温下将2-6 ML Ag沉积到Si(111)(root 3xroot 3)R30 - 40 Ag表面上之后,已经观察到Ag膜的(root 3xroot 3)R30 - 40 LEED结构。XPS研究表明,这些薄膜是固体,和UPS测量表明,它们是金属。然而,在更仔细的STM研究之后,我们发现这些薄膜由尖锐的Ag岛和其间的(root 3xroot 3)R30 ^o Ag平坦平台组成。在Si(001)上,低温沉积在覆盖率低至10 ML的具有孪晶Ag(111)结构的清洁Si(001)2x 1上产生Ag的外延生长。此外,还研究了Si(100)表面上几种单层Ag膜的电导率随温度(40-300 K)的变化。

英文摘要:

We studied the low temperature (T<130K) growth of Ag on Si(001) and Si(111) flat surfaces prepared by Si homo epitaxy with the aim to achieve thin metallic films. The band structure and morphology of the Ag overlayers have been investigated by means of XPS, UPS, LEED, STM and STS. Surprisingly a (root3xroot3)R30^o LEED structure for Ag films has been observed after deposition of 2-6 ML Ag onto a Si(111)(root3xroot3)R30^o Ag surface at low temperatures. XPS investigations showed that these films are solid, and UPS measurements indicate that they are metallic. However, after closer STM studies we found that these films consists of sharp Ag islands and (root3xroot3)R30^o Ag flat terraces in between. On Si(001) the low-temperature deposition yields an epitaxial growth of Ag on clean Si(001)2x1 with a twinned Ag(111) structure at coverages as low as 10 ML. Furthermore the conductivity of few monolayer Ag films on Si(100) surfaces has been studied as a function of temperature (40-300 K).

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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