X射线光电子能谱学研究CaCu $_3$ Ti $_4$ O $_{12}$的富Ti和贫Cu边界层
Ti-rich and Cu-poor grain-boundary layers of CaCu$_3$Ti$_4$O$_{12}$ detected by x-ray photoelectron spectroscopy
摘要：
用X射线光电子能谱学（XPS）和能量色散X射线谱（EDX）研究了CaCu $_3$ Ti $_4$ O $_{12}$陶瓷的切割和抛光表面。虽然EDX技术显示两个表面的相同的CaCu $_3$ Ti $_4$ O $_{12}$化学计量比，但XPS表明具有晶粒-边界层的解理表面是显著富Ti和贫Cu的。Cu 2 $p$的芯能级光谱明确地表明，一价铜只存在于解理表面。可能的晶界结构和它的形成进行了讨论。
英文摘要：
Cleaved and polished surfaces of CaCu$_3$Ti$_4$O$_{12}$ ceramics have been investigated by x-ray photoelectron spectroscopy (XPS) and energy dispersive x-ray spectroscopy (EDX), respectively. While EDX technique shows the identical CaCu$_3$Ti$_4$O$_{12}$ stoichiometry for the two surfaces, XPS indicates that the cleaved surface with grain-boundary layers is remarkably Ti-rich and Cu-poor. The core-level spectrum of Cu 2$p$ unambiguously shows the existence of monovalent copper only for the cleaved surface. Possible grain-boundary structure and its formation are discussed.
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