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arXiv 0706.0935quant-ph
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用等效对称投影法测量多维纠缠态

Experimental Measurement of Multi-dimensional Entanglement via Equivalent Symmetric Projection

F. W. Sun, J. M. Cai, J. S. Xu, G. Chen, B. H. Liu, C. F. Li, Z. W. Zhou, G. C. Guo

摘要:

我们构造了一个线性光学测量过程来测量光参量下转换过程中产生的一组$4 \times 4$维双光子纠缠纯态的纠缠测度,命名为\emph{I-concurrence}.在我们的实验中,对单个子系统(由L。Aolita和F. Mintert,Phys. Rev. Lett. \textbf{97},050501(2006))可以通过观察一侧双光子符合而无需在另一子系统上进行任何触发检测来实现。本文利用光子的不可逆性和聚束效应,首次实现了对双光子纯态纠缠的测量。我们的方法可以确定参量下转换过程中产生的一般高维二体纯态的\emph{I-concurrence}。

英文摘要:

We construct a linear optics measurement process to determine the entanglement measure, named \emph{I-concurrence}, of a set of $4 \times 4$ dimensional two-photon entangled pure states produced in the optical parametric down conversion process. In our experiment, an \emph{equivalent} symmetric projection for the two-fold copy of single subsystem (presented by L. Aolita and F. Mintert, Phys. Rev. Lett. \textbf{97}, 050501 (2006)) can be realized by observing the one-side two-photon coincidence without any triggering detection on the other subsystem. Here, for the first time, we realize the measurement for entanglement contained in bi-photon pure states by taking advantage of the indistinguishability and the bunching effect of photons. Our method can determine the \emph{I-concurrence} of generic high dimensional bipartite pure states produced in parametric down conversion process.

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