The high-Q harmonic oscillator mode of a Josephson junction can be used as a novel probe of spurious two-level systems (TLSs) inside the amorphous oxide tunnel barriers of the junction. In particular, we show that spectroscopic transmission measurements of the junction resonator mode can reveal how the coupling magnitude between the junction and the TLSs varies with an external magnetic field applied in the plane of the tunnel barrier. The proposed experiments offer the possibility of clearly resolving the underlying coupling mechanism for these spurious TLSs, an important decoherence source limiting the quality of superconducting quantum devices.
Continuous Tuning of the Charge-Phase Uncertainty in a Josephson Junction
Max-Planck-Institut für Festkörperforschung（马克斯·普朗克固体研究所）；Universidad Autónoma de Madrid（马德里自治大学）；Condensed Matter Physics Center (IFIMAC), Universidad Autónoma de Madrid（马德里自治大学凝聚态物理中心（IFIMAC））；Institute for Complex Quantum Systems and IQST, Universität Ulm（乌尔姆大学复杂量子系统与IQST研究所）；Institut de Physique, Ecole Polytechnique Fédérale de Lausanne（洛桑联邦理工学院物理研究所）
Scanning Gate Microscopy Modulation of Supercurrent in Graphene Josephson Junctions
Istituto Nanoscienze–CNR, NEST-Scuola Normale Superiore（意大利国家研究委员会纳米科学研究所，NEST-比萨高等师范学校）；Dipartimento di Fisica, Università di Genova（热那亚大学物理系）；CNR-SPIN（意大利国家研究委员会自旋物理学研究所）；Center for Nanotechnology Innovation, Laboratorio NEST, Istituto Italiano di Tecnologia（意大利理工大学NEST纳米技术创新中心）；Research Center for Electronic and Optical Materials, National Institute for Materials Science（日本物质材料研究机构电子与光学材料研究中心）；Research Center for Materials Nanoarchitectonics, National Institute for Materials Science（日本物质材料研究机构材料纳米构造研究中心）
Multiple Andreev Reflection Effects in Asymmetric STM Josephson Junctions
Laboratory for Physical Sciences（物理科学实验室）；Quantum Materials Center, Department of Physics, University of Maryland（马里兰大学物理系量子材料中心）；Joint Quantum Institute, University of Maryland（马里兰大学联合量子研究所）
Josephson transport in YBa${}_{2}$Cu${}_{3}$O${}_{7}$ weak links created by focused-helium-ion-beam irradiation: Analysis based on diffusive-SNS-junction model
National Institute of Advanced Industrial Science and Technology（日本产业技术综合研究所）
