arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 0704.0300cond-mat.mes-hallcond-mat.mtrl-sci
收藏

单壁碳纳米管电阻和电子平均自由程的标度

Scaling of Resistance and Electron Mean Free Path of Single-Walled Carbon Nanotubes

Meninder Purewal, Byung Hee Hong, Anirudhh Ravi, Bhupesh Chandra, James Hone, Philip Kim

摘要:

我们提出了一个实验研究的电阻在单个单壁碳纳米管器件的通道长度,不同的四个数量级的同一样品上的缩放。电子的平均自由程是从电阻与长度在不同温度下的线性标度得到的。低温时平均自由程由杂质散射决定,高温时平均自由程随温度的升高而减小,说明它受电子-声子散射的限制。在室温下,一个异常长的平均自由程已被实验证实。在极长的长度尺度上,电阻随长度呈指数增加,表明存在异常的局部化效应。

英文摘要:

We present an experimental investigation on the scaling of resistance in individual single walled carbon nanotube devices with channel lengths that vary four orders of magnitude on the same sample. The electron mean free path is obtained from the linear scaling of resistance with length at various temperatures. The low temperature mean free path is determined by impurity scattering, while at high temperature the mean free path decreases with increasing temperature, indicating that it is limited by electron-phonon scattering. An unusually long mean free path at room temperature has been experimentally confirmed. Exponentially increasing resistance with length at extremely long length scales suggests anomalous localization effects.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑